The technology developed addresses one of the main limitations of currently available single-photon detectors, namely the dead time that restricts their operation at high frequencies. In the context of technologies for ultra-fast single-photon detection, reducing dead time is a critical factor in enabling high repetition rate applications. The proposed solution meets this need through the development of an innovative electronic circuit.

The patented technology consists of an innovative electronic circuit that allows a single photon detector to operate using the fast-gating technique, achieving a dead time shorter than the gate time. The prototype, which incorporates this technology, has been successfully tested at 93 MHz and 100 MHz, but the design allows even higher frequencies to be achieved. One of the main strengths of the design is its simplicity of implementation, combined with high reliability. In addition, all the components used are readily available and characterized by a long service life, without being subject to significant wear and tear.
INFN and UNIMI
IT 102025000013111
Photon Detectors
P_25.015 e P_25.043
For more information about this technology, WRITE TO US