Scintillation detector in the absence of reflection elements

In the context of the detection of ionizing particles and two-dimensional reconstruction of their spatial characteristics, traditional technologies have limitations in terms of footprint, spurious reflections and sensitivity to ambient light. The present invention fits into this scenario by proposing a compact, mirrorless system capable of improving the acquisition quality by reducing background noise and simplifying the architecture of the detector.

How does it work?

The present technology aims to solve the technical problem of providing a system for the two-dimensional reconstruction of the characteristics detectable on a plane transverse to the direction of propagation of a beam of ionizing particles, overcoming the drawbacks associated with the prior art.

This problem is solved by an innovative mirrorless scintillation detection system, characterized by a series of constructive and functional expedients. The system comprises: (i) an internally coated opaque black casing, which prevents reflection of the internal light; and (ii) an opening on the casing at which a polymer film transparent to the incident particle beam is placed. This film has at least one opaque black surface, facing the scintillator, and has the function of shielding the interior of the casing from ambient light radiation. The system also comprises an acquisition unit, consisting of: (i) a focusing optical system; (ii) an optical sensor; and (iii) a scintillator, the first face of which is inclined so as to be partially facing both the incident radiation and the optical sensor array. In addition, the second face of the scintillator, as well as the side edges, are treated superficially with an opaque black coating, with the dual purpose of masking the back of the scintillator and reducing background noise on the optical sensor array.

Applications

• Diagnostic imaging in the medical field;
• High energy physics and scientific research.

Advantages

• Minimization of background noise of the acquired image;
• Maximisation of the ratio of detected light to emitted light;
• Low maintenance cost;
• Fewer elements subject to deterioration by radiation.