FPGA-based reconfigurable hadronic fluence sensor

Ionizing particle detector that incorporates both the sensitive element and the readout logic in a single FPGA (Field-Programmable Gate Array) chip and can be reprogrammed and configured.

How does it work?

Ionizing particles can cause a state change (Single Event Upset) in microelectronic devices such as static RAM memories (SRAM). The number of events is proportional to that of ionizing particles, so it is possible to use SRAM memories as fluence monitors.

A limitation of this approach is that separate components are needed to detect upsets and to read them, and the resulting system is therefore complicated and expensive; moreover, the readout logic is usually fixed and not reconfigurable.

In this invention, a single FPGA component implements both the sensitive element and the readout logic, which can also be programmed and reconfigured.

Applications

• Radiation monitoring at:
  • particle accelerators
  • high energy physics experiments
  • medical physics
  • irradiation facilities
  • radioactive waste repositories
  • nuclear power plants;
• monitoring of high-energy proton or neutron fluence (E>50 MeV);
• Neutron imaging.

Advantages

• single device as sensitive element and readout electronics;
• reprogrammable readout logic and configurable interface to back-end systems;
• compact board;
• digital serial output;
• low power (<2 W per sensor);
• lowest possible cost using commercial off-the-shelf components.