CHARACTERIZATION OF THERAPEUTIC BEAMS WITH CMOS
3D spatial profile | CMOS sensor | Pixel | RadiotherapyINTRODUCTION
The technology is an innovative system for the characterization and quality control of high intensity ionizing radiation beams used in the therapeutic field. It is based on the use of a CMOS image sensor for reconstructing the beam profile in three dimensions.The system is suitable for the characterization of small radiation fields.
TECHNICAL FEATURES
The invention stands as an alternative to the main systems currently in use in hospitals in daily QA for monitoring the spatial profile of radiotherapy beams. The technology uses a commercial CMOS image sensor with very high spatial segmentation (> 3x106 pixels / cm2). The high number of pixels reduces the problem of saturation, which current systems can suffer due to exposition to high intensity beams; also it allows a good isolation of the single particles making it possible to reconstruct the spatial profile of the beam.
POSSIBLE APPLICATIONS
- Beam characterization in conventional radiotherapy (photons and electrons);
- Beam characterizazion for hadrontherapy and IORT;
- X-rays beam characterization for sterilization processes.
ADVANTAGES
- Small sensor dimensions;
- Not expensive components;
- High radiation hardness;
- High radiation detection efficiency.
PATENT INFORMATION
PATENT OWNER
Istituto Nazionale di Fisica NuclearePATENT STATUS
GrantedPRIORITY NUMBER
RM2014A000455
PRIORITY DATE
04/082014LICENSE
ItalyCOMMERCIAL RIGHTS
ExclusiveAVAILABILITY
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